磁力检测标准，弹性模量试验

 spatial resolution. Bimodal atomic force microscopy is used to accurately map the effective spring constant between the microscope tip and sample, and a finite element method is developed to quantitatively account for the effect of substrate stiffness on deformation. Using these methods, the in-plane Young’s modulus of monolayer MoS2 can be decoupled from the substrate and determined as 265 ± 13 GPa, broadly consistent with previous reports though with substantially smaller uncertainty. It is also found that the elasticity of mono- and bi-layer MoS2 cannot be differentiated, which is confirmed by the first principles calculations. This method provides a convenient, robust and accurate means to map the in-plane Young’s modulus of 2D materials on a substrate.

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